Modeling and Suppression of the Crosstalk Issue Considering the Influence of the Parasitic Parameters of SiC MOSFETs Book Summary
This page condenses Modeling and Suppression of the Crosstalk Issue Considering the Influence of the Parasitic Parameters of SiC MOSFETs into a quick summary with author background, historical context, and chapter takeaways so you can understand Xiaoli Guo, Dian Wu, Lei Zhang, Xibo Yuan, Xinsong Zhang, Shugen Bai, Jian Zhong's core ideas faster.
Book Facts
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- Title
- Modeling and Suppression of the Crosstalk Issue Considering the Influence of the Parasitic Parameters of SiC MOSFETs
- Author
- Xiaoli Guo, Dian Wu, Lei Zhang, Xibo Yuan, Xinsong Zhang, Shugen Bai, Jian Zhong
- Reading Time
- 18.0 minutes
- Category
- Technology & The Future
- Audio
- Not available
Quick Answers
Start with the most useful search-style answers about Modeling and Suppression of the Crosstalk Issue Considering the Influence of the Parasitic Parameters of SiC MOSFETs.
Who is Xiaoli Guo, Dian Wu, Lei Zhang, Xibo Yuan, Xinsong Zhang, Shugen Bai, Jian Zhong?
Xiaoli Guo是南通大学电气工程学院的副教授,研究方向包括电力系统优化、可再生能源发电技术和储能技术。Dian Wu是南通大学电气工程学院的硕士研究生,研究方向包括基于SiC器件的变换器的寄生参数和串扰问题分析。
Who should read Modeling and Suppression of the Crosstalk Issue Considering the Influence of the Parasitic Parameters of SiC MOSFETs?
本文的目标读者是对SiC MOSFET器件及其在电力电子变换器中的应用感兴趣的工程师、研究人员和学生。特别是那些关注SiC MOSFET的串扰问题,以及希望找到有效方法来抑制这种串扰以提高变换器可靠性的专业人士。
What is the background behind Modeling and Suppression of the Crosstalk Issue Considering the Influence of the Parasitic Parameters of SiC MOSFETs?
随着SiC MOSFET等宽禁带半导体器件在高压、大容量和高开关频率变换器中得到越来越广泛的应用,其串扰问题比Si IGBT更为严重。传统的Si IGBT串扰抑制方法不能直接应用于SiC MOSFET,而且由于SiC MOSFET开关时具有较大的di/dt和dv/dt,共源电感等寄生参数对串扰问题的...
Key Points
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Target Audience
本文的目标读者是对SiC MOSFET器件及其在电力电子变换器中的应用感兴趣的工程师、研究人员和学生。特别是那些关注SiC MOSFET的串扰问题,以及希望找到有效方法来抑制这种串扰以提高变换器可靠性的专业人士。此外,本文对寄生参数影响的深入分析和建模,也适合那些希望深入了解SiC MOSFET工作原理和性能的研究人员。
Historical Context
随着SiC MOSFET等宽禁带半导体器件在高压、大容量和高开关频率变换器中得到越来越广泛的应用,其串扰问题比Si IGBT更为严重。传统的Si IGBT串扰抑制方法不能直接应用于SiC MOSFET,而且由于SiC MOSFET开关时具有较大的di/dt和dv/dt,共源电感等寄生参数对串扰问题的影响越来越明显。因此,如何更好地抑制SiC MOSFET的串扰,特别是考虑各种寄生参数,成为学术界和工业界关注的焦点。